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D R Rock

Biographic Data

ID9252525
NAMED R Rock
GIVEN NAMESD R
FAMILY NAMERock
SIGNATUREROCK D R
AFFILIATIONSEducational Testing Service
VERIFIEDNo
TOTAL WORKS2
TOTAL CITATIONS0
AUTHOR COUNT2
EDITOR COUNT0
FIRST PUBLICATION YEAR1978
LATEST PUBLICATION YEAR1980
H-INDEX0
  • Using Longitudinal Data to Estimate Reliability in the Presence of Correlated Measurement Errors

    Open Access•Charles E Werts, Hunter M Breland et al.•ARTICLE•Educational and Psychological…•1980

    Test-retest correlations can lead to biased reliability estimates when there is instability of the true scores in the interval between tests and/or when the measurement errors are correlated. Using three occasion data on the Test of Standard Written English and essay ratings, an analysis is demonstrated which separates true score instability and correlated errors

  • A General Method of Estimating the Reliability of a Composite

    Open Access•Charles E Werts, Donald Rock et al.•ARTICLE•Educational and Psychological…•1978

    A procedure for estimating the reliability of a factorially complex composite is considered

No prominent works on this page.

  • A General Method of Estimating the Reliability of a Composite

    Open Access•Charles E Werts, Donald Rock et al.•ARTICLE•Educational and Psychological…•1978

    A procedure for estimating the reliability of a factorially complex composite is considered

  • Using Longitudinal Data to Estimate Reliability in the Presence of Correlated Measurement Errors

    Open Access•Charles E Werts, Hunter M Breland et al.•ARTICLE•Educational and Psychological…•1980

    Test-retest correlations can lead to biased reliability estimates when there is instability of the true scores in the interval between tests and/or when the measurement errors are correlated. Using three occasion data on the Test of Standard Written English and essay ratings, an analysis is demonstrated which separates true score instability and correlated errors

Econometrics (2 works) · Mathematics (2 works) · Physics (2 works) · Psychology (2 works) · Reliability (semiconductor) (2 works) · Statistics (2 works) · Aerospace, Electronics, Mathematical Modeling (1 works) · Algorithm (1 works) · Composite number (1 works) · Computer Science (1 works)

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