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S Rajendran

Datos Biográficos

ID8991518
NOMBRES Rajendran
NOMBRESS
APELLIDORajendran
FIRMARAJENDRAN S
AFILIACIONESAlagappa University
ORCID0009-0002-4361-3571
VERIFICADOSí
TOTAL DE OBRAS5
TOTAL DE CITAS4
TOTAL COMO AUTOR5
TOTAL COMO EDITOR0
PRIMER AÑO DE PUBLICACIÓN1986
AÑO MÁS RECIENTE DE PUBLICACIÓN2011
ÍNDICE H1
  • Electrodeposition of CdSe Thin Films from Aqueous Solution

    T Mahalingam, V Dhanasekaran et al.•ARTICLE•New Materialisms•2011

    CdSe thin film was electrodeposited from an aqueous solution of CdSO4 and H2SeO3 at 75oC on indium tin oxide (ITO)-covered glass substrates. The deposition films were characterized with X-ray diffraction (XRD), scanning electron microscope (SEM), energy dispersive analysis by X-rays (EDAX), photoluminescence (PL) and UV spectrometry, respectively. XRD analysis shows that the films are exhibit in polycrystalline nature with hexagonal structure. Th…

  • Electroplated CuO Thin Films from High Alkaline Solutions

    V Dhanasekaran, T Mahalingam et al.•ARTICLE•New Materialisms•2011

    CuO thin films were coated on ITO substrates by an electrodeposition route through potentiostatic mode. The electrodeposited CuO thin films were characterized and the role of copper sulphate concentration on the structural, morphological and optical properties of the CuO films was studied. Film thickness was measured by a stylus profilometer and found to be in the range between 800 and 1400 nm. The structural characteristics studies were carried …

  • Annealing Effects on the Properties of Electrodeposited CdSSe Thin Films

    T Mahalingam, V Dhanasekaran et al.•ARTICLE•New Materialisms•2011

    The effect of post heat treatment on structural, morphological and optical properties of electrodeposited CdSSe solid solution thin films were studied using X-ray diffractometer (XRD), scanning electron microscopy (SEM), and UV-Vis-NIR spectrophotometer, respectively. X-ray diffraction patterns revealed that polycrystalline nature with hexagonal structure of CdSSe thin films. Also the microstructural properties are calculated tends to increase an…

  • Electrosynthesis and Studies on CdZnSe Thin Films

    T Mahalingam, V Dhanasekaran et al.•ARTICLE•New Materialisms•2011

    Electrodeposited CdZnSe thin films have been prepared at various bath temperatures. The thickness of the films was estimated between 850 nm and 1500 nm by stylus method. The X-ray diffraction patterns revealed that the polycrystalline nature with cubic structure of CdZnSe alloy thin films. Microstructural properties such as, crystallite size, dislocation density, microstrain and number of crystallites per unit area were calculated using predomina…

  • Population movement and malaria persistence in Rameswaram Island

    Open Access•P K Rajagopalan, P Jambulingam et al.•ARTICLE•Social Science & Medicine•1986•Citada por: 4•Referencias: 2

  • Population movement and malaria persistence in Rameswaram Island

    Open Access•P K Rajagopalan, P Jambulingam et al.•ARTICLE•Social Science & Medicine•1986•Citada por: 4•Referencias: 2

  • Population movement and malaria persistence in Rameswaram Island

    Open Access•P K Rajagopalan, P Jambulingam et al.•ARTICLE•Social Science & Medicine•1986•Citada por: 4•Referencias: 2

  • Electrodeposition of CdSe Thin Films from Aqueous Solution

    T Mahalingam, V Dhanasekaran et al.•ARTICLE•New Materialisms•2011

    CdSe thin film was electrodeposited from an aqueous solution of CdSO4 and H2SeO3 at 75oC on indium tin oxide (ITO)-covered glass substrates. The deposition films were characterized with X-ray diffraction (XRD), scanning electron microscope (SEM), energy dispersive analysis by X-rays (EDAX), photoluminescence (PL) and UV spectrometry, respectively. XRD analysis shows that the films are exhibit in polycrystalline nature with hexagonal structure. Th…

  • Electroplated CuO Thin Films from High Alkaline Solutions

    V Dhanasekaran, T Mahalingam et al.•ARTICLE•New Materialisms•2011

    CuO thin films were coated on ITO substrates by an electrodeposition route through potentiostatic mode. The electrodeposited CuO thin films were characterized and the role of copper sulphate concentration on the structural, morphological and optical properties of the CuO films was studied. Film thickness was measured by a stylus profilometer and found to be in the range between 800 and 1400 nm. The structural characteristics studies were carried …

  • Annealing Effects on the Properties of Electrodeposited CdSSe Thin Films

    T Mahalingam, V Dhanasekaran et al.•ARTICLE•New Materialisms•2011

    The effect of post heat treatment on structural, morphological and optical properties of electrodeposited CdSSe solid solution thin films were studied using X-ray diffractometer (XRD), scanning electron microscopy (SEM), and UV-Vis-NIR spectrophotometer, respectively. X-ray diffraction patterns revealed that polycrystalline nature with hexagonal structure of CdSSe thin films. Also the microstructural properties are calculated tends to increase an…

  • Electrosynthesis and Studies on CdZnSe Thin Films

    T Mahalingam, V Dhanasekaran et al.•ARTICLE•New Materialisms•2011

    Electrodeposited CdZnSe thin films have been prepared at various bath temperatures. The thickness of the films was estimated between 850 nm and 1500 nm by stylus method. The X-ray diffraction patterns revealed that the polycrystalline nature with cubic structure of CdZnSe alloy thin films. Microstructural properties such as, crystallite size, dislocation density, microstrain and number of crystallites per unit area were calculated using predomina…

Band gap (4 obras) · Composite material (4 obras) · Crystallite (4 obras) · Materials Science (4 obras) · Metallurgy (4 obras) · Nanotechnology (4 obras) · Optoelectronics (4 obras) · Thin film (4 obras) · Chalcogenide Semiconductor Thin Films (3 obras) · Chemistry (3 obras)

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