P V Chandrasekar
Datos Biográficos
| ID | 8991979 |
|---|---|
| NOMBRE | P V Chandrasekar |
| NOMBRES | P V |
| APELLIDO | Chandrasekar |
| FIRMA | CHANDRASEKAR P V |
| AFILIACIONES | Fuzhou University |
| VERIFICADO | No |
| TOTAL DE OBRAS | 2 |
| TOTAL DE CITAS | 0 |
| OBRAS COMO AUTOR | 2 |
| OBRAS COMO EDITOR | 0 |
| PRIMER AÑO DE PUBLICACIÓN | 2014 |
| AÑO MÁS RECIENTE DE PUBLICACIÓN | 2014 |
| ÍNDICE H | 0 |
Growth and Characterization of Electroplated NiO Coatings
Thin films of NiO have been prepared using potentiostatic electrodeposition technique from an aqueous electrolytic bath containing NiSO4. Deposited films have been characterized using x-ray diffraction, scanning electron microscopy and energy dispersive analysis by x-rays. X-ray diffraction patterns showed that the prepared films possess polycrystalline nature with face centered cubic structure. Surface morphology and film composition showed that…
Studies on Electrodeposited NiS Thin Films
Thin films of NiS have been deposited on indium doped tin oxide coated conducting glass substrates using electrodeposition technique. Structural studies revealed that the deposited films exhibit hexagonal structure with preferential orientation along (002) plane. Structural parameters such as crystallite size, strain and dislocation density are calculated for films with different thickness values obtained at various deposition time. The film comp…
Sin obras prominentes en esta página.
Growth and Characterization of Electroplated NiO Coatings
Thin films of NiO have been prepared using potentiostatic electrodeposition technique from an aqueous electrolytic bath containing NiSO4. Deposited films have been characterized using x-ray diffraction, scanning electron microscopy and energy dispersive analysis by x-rays. X-ray diffraction patterns showed that the prepared films possess polycrystalline nature with face centered cubic structure. Surface morphology and film composition showed that…
Studies on Electrodeposited NiS Thin Films
Thin films of NiS have been deposited on indium doped tin oxide coated conducting glass substrates using electrodeposition technique. Structural studies revealed that the deposited films exhibit hexagonal structure with preferential orientation along (002) plane. Structural parameters such as crystallite size, strain and dislocation density are calculated for films with different thickness values obtained at various deposition time. The film comp…
Band gap (2 obras) · Chemistry (2 obras) · Composite material (2 obras) · Crystallite (2 obras) · Materials Science (2 obras) · Metallurgy (2 obras) · Nanotechnology (2 obras) · Optoelectronics (2 obras) · Scanning electron microscope (2 obras) · Thin film (2 obras)