Test-Retest Reliability of the Epps
Datos Bibliográficos
| ID | 20284591 |
|---|---|
| Autores | Daniel V Caputo (Queens College, CUNY), George Psathas (Washington University in St. Louis), Jon M Plapp (Washington University in St. Louis) |
| Año | 1966 |
| Volumen | 26 |
| Número | 4 |
| Páginas | 883-886 |
| Fecha de publicación | 1966-12-01 |
| Peer Reviewed | Sí |
| Open Access | Sí |
| Tipo | ARTICLE |
| Revista | Educational and Psychological Measurement (JOURNAL) |
| Identificadores de la revista | ISSN: 0013-1644 • E-ISSN: 1552-3888 |
| Editorial | SAGE Publications (PUBLISHER • US) |
| DOI | 10.1177/001316446602600408 |
| OpenAlex | W1998925567 |
| Idioma | EN |
| Citas recibidas | 8 |
| Referencias citadas | 5 |
Reliability (semiconductor) · Reliability engineering · Statistics · Test (biology) · Electrostatic Discharge in Electronics · Engineering · Mathematics · Psychology · Safety Systems Engineering in Autonomy · VLSI and Analog Circuit Testing
Temporal stability of personality by questionnaire
Factors that influence the temporal stability of personality by questionnaire
Stability and change of personality traits, self-esteem, and well-being
The hierarchy of consistency
Stability of Edwards Personal Preference Schedule Need Scale Scores and Profiles Over a Seven-Week Interval1
The rank-order consistency of personality traits from childhood to old age
A Reliability Study of Shostrom's Personal Orientation Inventory
Patterns of mean-level change in personality traits across the life course
| Obras citantes distintas | 8 |
|---|---|
| Citas por año | 0,14 |
| Intervalo de citas | 1968 - 2016 (49) |
| Velocidad de citación | historical |
| Altamente citado | No |
| Tipos de cita | Neutras: 5 |