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Shift Detection Comparison For Sized Biased And Area Biased Exponential Distributions Based Control Charts

Bibliographic Data

ID15537489
AuthorsAdeel Anjum (0000-0001-5083-0019, corresponding author), Muhammad Z Iqbal (0000-0001-5369-5588), Muhammad Kashif (0000-0001-7951-6568), Madiha Ghamkhar (0000-0002-1897-6939)
Year2024
Volume21
Issue8
Pages1-13
Publication date2024-06-06
Open AccessYes
TypeARTICLE
VenueMIGRATION LETTERS (JOURNAL)
Journal identifiersISSN: 1741-8984 • E-ISSN: 1741-8992
PublisherDewspublication (PUBLISHER)
DOI10.59670/ml.v21is11.10731
OpenAlexW4400062463
LanguageEN
References cited1

Probability distribution models are very helpful to solving many real-life problems. The development of new or extensions to an existing model is a very attractive area of research. Among many types of probability distribution models, weighted distributions are becoming more important for modeling data. Weighted distributions can help discover defects in manufacturing and outliers by weighting significant observations. Control charts are the most important tools to monitor process efficiency. In recent decades, researchers have focused on weighted distributions, especially those with size and area biased exponential distribution. This research introduces a novel control chart for a characteristic following a size-biased and area-biased exponential distribution to emphasize the relevance of weighted distributions. Charts are effectively determines size-biased and area-biased exponential distribution control chart limits also Monte Carlo simulations are used to assess different Average Run Length (ARL) values

Chart · Control chart · Econometrics · Exponential distribution · Exponential function · Gamma distribution · Monte Carlo method · Outlier · Probability distribution · Process (computing · Statistical process control · Statistics · Weighting · Advanced Statistical Methods and Models · Advanced Statistical Process Monitoring · Computer Science · Fault Detection and Control Systems · Mathematics

  • Advancing Quality Assurance In Manufacturing

    Open Access•Taswar Iqbal, Muhammad Z Iqbal et al.•MIGRATION LETTERS•2024

Highly citedNo

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