Test-Retest Reliability of the Epps
Dados Bibliográficos
| ID | 20284591 |
|---|---|
| Autores | Daniel V Caputo (Queens College, CUNY), George Psathas (Washington University in St. Louis), Jon M Plapp (Washington University in St. Louis) |
| Ano | 1966 |
| Volume | 26 |
| Fascículo | 4 |
| Páginas | 883-886 |
| Data de publicação | 1966-12-01 |
| Peer Reviewed | Sim |
| Open Access | Sim |
| Tipo | ARTICLE |
| Periódico | Educational and Psychological Measurement (JOURNAL) |
| Identificadores do periódico | ISSN: 0013-1644 • E-ISSN: 1552-3888 |
| Editora | SAGE Publications (PUBLISHER • US) |
| DOI | 10.1177/001316446602600408 |
| OpenAlex | W1998925567 |
| Idioma | EN |
| Citações recebidas | 8 |
| Referências citadas | 5 |
Reliability (semiconductor) · Reliability engineering · Statistics · Test (biology) · Electrostatic Discharge in Electronics · Engineering · Mathematics · Psychology · Safety Systems Engineering in Autonomy · VLSI and Analog Circuit Testing
Temporal stability of personality by questionnaire
Factors that influence the temporal stability of personality by questionnaire
Stability and change of personality traits, self-esteem, and well-being
The hierarchy of consistency
Stability of Edwards Personal Preference Schedule Need Scale Scores and Profiles Over a Seven-Week Interval1
The rank-order consistency of personality traits from childhood to old age
A Reliability Study of Shostrom's Personal Orientation Inventory
Patterns of mean-level change in personality traits across the life course
| Obras citantes distintas | 8 |
|---|---|
| Citações por ano | 0,14 |
| Intervalo de citações | 1968 - 2016 (49) |
| Velocidade de citação | historical |
| Altamente citado | Não |
| Tipos de citação | Neutras: 5 |