Determining Optimal Test Lengths with a Fixed Total Testing Time
Bibliographic Data
| ID | 20287248 |
|---|---|
| Authors | Ronald K Hambleton (0000-0002-7412-2188, University of Massachusetts Amherst, corresponding author) |
| Year | 1987 |
| Volume | 47 |
| Issue | 2 |
| Pages | 339-347 |
| Publication date | 1987-06-01 |
| Open Access | Yes |
| Type | ARTICLE |
| Venue | Educational and Psychological Measurement (JOURNAL) |
| Journal identifiers | ISSN: 0013-1644 • E-ISSN: 1552-3888 |
| Publisher | SAGE Publications (PUBLISHER • US) |
| DOI | 10.1177/0013164487472005 |
| OpenAlex | W2088640643 |
| Language | EN |
| Citations received | 1 |
| References cited | 4 |
The problem of determining optimal test lengths with fixed total testing time has proven to be a difficult one for criterion-referenced test developers. A solution is offered in this paper in which test lengths are determined by considering the importance, reliability, and validity of scores measuring objectives in a criterion-referenced test with a constraint set on the total desired test length
Constraint (computer-aided design) · Geometry · Reliability (semiconductor) · Set (abstract data type) · Statistics · Test (biology) · Computer Science · Mathematics · Optimal Experimental Design Methods · Software Reliability and Analysis Research · VLSI and Analog Circuit Testing
| Citations per year | 0.17 |
|---|---|
| Citation span | 2020 - 2020 (1) |
| Highly cited | No |