Evaluation of Return Difference and Sensitivity
Bibliographic Data
| ID | 20296798 |
|---|---|
| Authors | K K Murthy, Kruthi Murthy (corresponding author) |
| Year | 1970 |
| Volume | 13 |
| Issue | 2 |
| Pages | 99-100 |
| Publication date | 1970-08-01 |
| Open Access | Yes |
| Type | ARTICLE |
| Venue | IEEE Transactions on Education (JOURNAL) |
| Journal identifiers | ISSN: 0018-9359 • E-ISSN: 1557-9638 |
| Publisher | Institute of Electrical and Electronics Engineers (IEEE) (PUBLISHER) |
| DOI | 10.1109/te.1970.4320577 |
| OpenAlex | W2009306266 |
| Language | EN |
| References cited | 2 |
Return difference and sensitivity with respect to a parameter can be easily evaluated when the first power of the parameter occurs as a unique branch transmittance. The method has been extended to cases when the parameter and its higher powers occur as transmittances in more than one branch
Electronic engineering · Optics · Physics · Sensitivity (control systems) · Transmittance · Advancements in Photolithography Techniques · Engineering · Mathematics
| Highly cited | No |
|---|