Research on classification and similarity of patent citation based on deep learning
Bibliographic Data
| ID | 21442886 |
|---|---|
| Authors | Yonghe Lu (0000-0002-7758-9365, Sun Yat-sen University, corresponding author), Xin Xiong (0000-0003-0902-7886, Sun Yat-sen University), Weiting Zhang (0000-0002-7473-2234, Sun Yat-sen University), Jiaxin Liu (0009-0000-5496-3011, Sun Yat-sen University), Ruijie Zhao (0009-0003-1867-3422, Sun Yat-sen University) |
| Year | 2020 |
| Volume | 123 |
| Issue | 2 |
| Pages | 813-839 |
| Publication date | 2020-05-01 |
| Open Access | Yes |
| Type | ARTICLE |
| Venue | Scientometrics (JOURNAL) |
| Journal identifiers | ISSN: 0138-9130 • E-ISSN: 1588-2861 |
| Publisher | Springer Science and Business Media LLC (PUBLISHER) |
| DOI | 10.1007/s11192-020-03385-w |
| OpenAlex | W3007096683 |
| Language | EN |
| Citations received | 5 |
| References cited | 17 |
Data mining · Deep learning · Image (mathematics) · Information retrieval · Machine learning · Perspective (graphical) · Relevance (law) · Robustness (evolution) · Similarity (geometry) · Value (mathematics) · Artificial Intelligence · Computer Science · Innovation Policy and RD · Intellectual Property and Patents · Machine Learning in Materials Science
A two-stage deep learning-based system for patent citation recommendation
What matters in patent claims
Mapping the sustainable development goals (SDGs) in science, technology and innovation
Knowledge graph enhanced citation recommendation model for patent examiners
A novel patentability detection model based on Siamese network
| Citations per year | 1.25 |
|---|---|
| Citation span | 2022 - 2025 (4) |
| Highly cited | No |