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Experience effects of patent examiners

An empirical study of the career length and citation patterns on triadic patents

Bibliographic Data

ID21443665
AuthorsTetsuo Wada (0000-0002-4402-7681, Gakushuin University, corresponding author)
Year2024
Volume129
Issue10
Pages6333-6348
Publication date2024-10-01
Peer ReviewedYes
Open AccessYes
TypeARTICLE
VenueScientometrics (JOURNAL)
Journal identifiersISSN: 0138-9130 • E-ISSN: 1588-2861
PublisherSpringer Science and Business Media LLC (PUBLISHER)
DOI10.1007/s11192-024-05037-9
OpenAlexW4397032435
LanguageEN
References cited17

Business · Citation · Citation analysis · Empirical research · Library science · Regional science · Sociology · Statistics · Computer Science · Entrepreneurship Studies and Influences · Innovation Policy and RD · Intellectual Property and Patents · Mathematics · Psychology

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Citation velocityhistorical
Highly citedNo

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Ethnos_APP • Open Source Project • MIT License • Frontend v2.0.0 • Privacy and Cookies • API Documentation: api.ethnos.app/docs • API Source Code: GitHub • DOI: 10.5281/zenodo.17049435 • Frontend Source Code: GitHub • DOI: 10.5281/zenodo.17050053 • cruz.rio.br • Expectantes Misericordiae