Zur analyse von markern
Bibliographic Data
| ID | 3410347 |
|---|---|
| Authors | Pierre Cadiot (Université Paris 8, corresponding author) |
| Year | 1994 |
| Volume | 22 |
| Issue | 6 |
| Pages | 687-689 |
| Publication date | 1994-12-01 |
| Peer Reviewed | Yes |
| Open Access | Yes |
| Type | ARTICLE |
| Venue | Journal of Pragmatics (JOURNAL) |
| Journal identifiers | ISSN: 0378-2166 • E-ISSN: 1879-1387 |
| Publisher | Elsevier BV (PUBLISHER) |
| DOI | 10.1016/0378-2166(94)90038-8 |
| OpenAlex | W2618005057 |
| Language | EN |
| Citations received | 3 |
| References cited | 1 |
Channelling · Crystallography · Diffraction · Diffraction topography · Electron · Electron backscatter diffraction · Electron diffraction · Lattice (music · Optics · Physics · Reciprocal lattice · Scattering · Zone axis · Advanced Electron Microscopy Techniques and Applications · Anodic Oxide Films and Nanostructures · Chemistry · Electron and X-Ray Spectroscopy Techniques · Materials Science
| Unique citing works | 3 |
|---|---|
| Citations per year | 0,1 |
| Citation span | 1996 - 1999 (4) |
| Citation velocity | historical |
| Highly cited | No |
| Citation types | Neutral: 3 |