Memory Effects in an AMS System
Catastrophe and Recovery
Bibliographic Data
| ID | 9242261 |
|---|---|
| Authors | J S Vogel, J R Southon, D E Nelson (0000-0002-5676-4451) |
| Year | 1990 |
| Volume | 32 |
| Issue | 1 |
| Pages | 81-83 |
| Publication date | 1990-01-01 |
| Open Access | Yes |
| Type | ARTICLE |
| Venue | Radiocarbon (JOURNAL) |
| Journal identifiers | ISSN: 0033-8222 • E-ISSN: 1945-5755 |
| Publisher | Cambridge University Press (CUP) (PUBLISHER) |
| DOI | 10.1017/s0033822200039965 |
| OpenAlex | W1855515607 |
| Language | EN |
| Citations received | 4 |
| References cited | 2 |
A sample with a 14 C concentration estimated to be greater than 30,000 Modern was inadvertently graphitized and measured in an AMS system. No measurable contamination of the cesium sputter ion source was observed. Simple cleaning procedures removed the contamination from the sample preparation system, with the exception of the reaction vessel in which the sample was graphitized. Sample cross-contamination factors were estimated for all of the preparation and measurement procedures
Accelerator mass spectrometry · Caesium · Chromatography · Contamination · Mass spectrometry · Radiochemistry · Sample Preparation · Chemistry · Environmental Science · Materials Science · Nuclear Physics and Applications · Radiation Detection and Scintillator Technologies · Radioactive contamination and transfer · Environmental Chemistry · Inorganic Chemistry
| Citations per year | 0.14 |
|---|---|
| Citation span | 1997 - 2016 (20) |
| Highly cited | No |