Future studies defects
Bibliographic Data
| ID | 9842253 |
|---|---|
| Authors | Yehezkel Dror (0000-0001-5386-752X, Hebrew University of Jerusalem, corresponding author) |
| Year | 1993 |
| Volume | 25 |
| Issue | 3 |
| Pages | 351-352 |
| Publication date | 1993-04-01 |
| Peer Reviewed | Yes |
| Open Access | Yes |
| Type | ARTICLE |
| Venue | Futures (JOURNAL) |
| Journal identifiers | ISSN: 0016-3287 • E-ISSN: 1873-6378 |
| Publisher | Elsevier BV (PUBLISHER) |
| DOI | 10.1016/0016-3287(93)90144-i |
| OpenAlex | W2075292697 |
| Language | EN |
| References cited | 2 |
Political science · Advanced Electron Microscopy Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis · VLSI and Analog Circuit Testing
| Citation velocity | historical |
|---|---|
| Highly cited | No |